发明名称 Data structure of defective address information and defective address information encoding method for memory array
摘要 A defective address information encoding method for a memory array is provided. A page of the memory array is divided into plural segments. Each segment contains 2m bits. The defective address information encoding method includes the following steps. Firstly, positions of N1 fail bits in a first segment of the plural segments are acquired. Then, an (N1+1)-bit first segment start code is generated. Then, N1 m-bit defective codes are generated. The N1 m-bit defective codes follow the first segment start code to indicate the positions of the N1 fail bits in the first segment, wherein N1 is zero or a positive integer, and m is a positive integer.
申请公布号 US9299460(B1) 申请公布日期 2016.03.29
申请号 US201514690859 申请日期 2015.04.20
申请人 LITE-ON TECHNOLOGY CORPORATION 发明人 Zeng Shih-Jia;Fu Jen-Chien
分类号 G11C16/06;G11C29/00;G11C16/08 主分类号 G11C16/06
代理机构 WPAT, PC 代理人 WPAT, PC ;King Justin
主权项 1. A data structure of a defective address information in a memory array, a page of the memory array being divided into plural segments, each segment containing 2m bits, the data structure of the defective address information comprising: plural segment codes corresponding to the plural segments, wherein a first segment code of the plural segment codes is assigned to a first segment, and the first segment contains N fail bits, wherein the first segment code comprises: a first segment start code having (N+1) bits to indicate a fail bit number of the first segment; andN m-bit defective codes following the first segment start code to indicate positions of the N fail bits in the first segment, wherein N is zero or a positive integer, and m is a positive integer.
地址 Taipei TW