发明名称 CLEANING METHOD FOR SEMICONDUCTOR DEVICE FABRICATION
摘要 The present invention relates to a method for cleaning a substrate such as a semiconductor substrate for the manufacture of an integrated circuit. The method includes cleaning a semiconductor substrate with a first mixture consisting of ozone and at least one of an acid and a base, followed by a second mixture consisting of ozone and the other one of the acid and base. The cleaning mixtures can further include ultrapure water. According to one embodiment of the present invention, the mixtures can be applied on a surface of the heated substrate. The acid can be HF and the base can be NH_4OH.
申请公布号 KR20160033572(A) 申请公布日期 2016.03.28
申请号 KR20140193136 申请日期 2014.12.30
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 CHOU BO WEI;CHEN CHAO CHENG;YEH MING HSI;WU SUNG HSUN;JANG SYUN MING
分类号 H01L21/02;H01L21/302 主分类号 H01L21/02
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