发明名称 THE METHOD AND APPARATUS FOR PERFORMING RAY-NODE INTERSECTION TEST
摘要 Disclosed are a method and apparatus for performing a ray-node intersection test. The method of the present invention comprises the followings steps: receiving a coordinate value of a bounding box, and an origin coordinate value of a ray as a fixed point value; obtaining a difference value between the received coordinate value of the bounding box and the origin coordinate value; and obtaining a value of the obtained difference value multiplied by a reciprocal value of a direction vector of the ray, wherein the reciprocal value is a floating point value.
申请公布号 KR20160033551(A) 申请公布日期 2016.03.28
申请号 KR20140124636 申请日期 2014.09.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HWANG, SEOK JOONG;SHIN, YOUNG SAM;LEE, WON JONG;LEE, JAE DON
分类号 G06T15/06;G06F5/01 主分类号 G06T15/06
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