| 摘要 |
A device for inspecting defects of a test object using an eddy current according to the present invention includes: a differential signal generation part for generating a differential signal by the eddy current induced in the test object by supplying magnetic flux to the test object continuously according to an inputted carrier signal; a defect signal acquisition part for acquiring a defect signal showing a level of defect of the test object from the differential signal generated from the differential signal generation part; an A/D conversion part for converting the defect signal acquired from the defect signal acquisition part into digital data; and a demodulation part for demodulating the digital data converted by the A/D conversion part. By the present invention, in inspecting the defects existing in the test object, the device can increase accuracy since only the defect signal showing the level of defect of the test object is acquired and demodulated, and can perform digital demodulation regardless of a frequency value of an exciting frequency since the demodulation of the defect signal is performed through an average value calculation part connected to a mixer, and can increase analysis accuracy as to the defects. |
