发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD, COATING FORMATION METHOD, AND COATING FORMATION DEVICE
摘要 In the present method, a substrate to be processed, having an interlayer insulation film, is prepared (step 1); the interlayer insulation film is subjected to dry etching, while using an intervening mask layer, thereby forming recessed parts (step 2); residue is removed by dry ashing (step 3); a coating is formed on the entire surface by means of a gas process using a coating-use compound gas, with a molecular structure having at one terminal a first substitution group that reacts with and bonds with the surface of the interlayer insulation film, and at the other terminal a second substitution group that is hydrophilic (step 4); the coating is removed by wet cleaning (step 5); and wiring is formed in the recessed parts (step 6).
申请公布号 WO2016042898(A1) 申请公布日期 2016.03.24
申请号 WO2015JP69899 申请日期 2015.07.10
申请人 TOKYO ELECTRON LIMITED 发明人 ASAKO RYUICHI
分类号 H01L21/3205;H01L21/768;H01L23/532 主分类号 H01L21/3205
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