发明名称 SENSOR ELEMENT, ANALYZER, AND ELECTRONIC EQUIPMENT
摘要 PROBLEM TO BE SOLVED: To provide a sensor element in which changes in a metal fine structure layer are suppressed during storage and the metal fine structure layer can be easily used in a state similar as much as possible to the designed structure.SOLUTION: The sensor element of the present invention includes: a substrate with a metal fine structure layer disposed on one main surface thereof; a first cover disposed on the first main surface of the substrate and forming a cavity that houses a part of the metal fine structure layer; and a second cover disposed on the first main surface of the substrate and forming a cavity that houses a different part of the metal fine structure layer from the above part of the metal fine structure layer. The first cover and the second cover are sucked to the substrate when the pressure in the cavities formed by the covers is less than the pressure outside the cavities, and are away from the substrate when the pressure in the cavities is equal to or higher than the pressure outside the cavities. The pressure in the cavity formed by the first cover is different from the pressure in the cavity formed by the second cover.SELECTED DRAWING: Figure 1
申请公布号 JP2016040522(A) 申请公布日期 2016.03.24
申请号 JP20140164120 申请日期 2014.08.12
申请人 SEIKO EPSON CORP 发明人 MIYAZAWA TATSUNORI
分类号 G01N21/65 主分类号 G01N21/65
代理机构 代理人
主权项
地址