发明名称 METHOD FOR MAKING A PHOTOLITHOGRAPHY MASK INTENDED FOR THE FORMATION OF CONTACTS, MASK AND INTEGRATED CIRCUIT CORRESPONDING THERETO
摘要 A method for making a photolithography mask for formation of electrically conducting contact pads between tracks of a metallization level and electrically active zones of integrated circuits formed on a semiconductor wafer includes forming a first mask region including first opening zones intended for the formation of the contact pads. The first opening zone has a first degree of opening that is below a threshold. A second mask region including additional opening zones is formed, with the overall degree of opening of the mask being greater than or equal to the threshold.
申请公布号 US2016086883(A1) 申请公布日期 2016.03.24
申请号 US201514956903 申请日期 2015.12.02
申请人 STMICROELECTRONICS (ROUSSET) SAS 发明人 BOUTON GUILHEM;REGNIER PATRICK
分类号 H01L23/528;H01L23/522;G03F1/50;H01L23/00 主分类号 H01L23/528
代理机构 代理人
主权项
地址 ROUSSET FR