发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF |
摘要 |
A semiconductor device includes an SOI substrate and a MISFET formed on the SOI substrate. The SOI substrate has a base substrate, a ground plane region formed on the base substrate, a BOX layer formed on the ground plane region and an SOI layer formed on the BOX layer. The base substrate is made of silicon and the ground plane region includes a semiconductor region made of silicon carbide. |
申请公布号 |
US2016087069(A1) |
申请公布日期 |
2016.03.24 |
申请号 |
US201514864781 |
申请日期 |
2015.09.24 |
申请人 |
Renesas Electronics Corporation |
发明人 |
ODA Hidekazu |
分类号 |
H01L29/66;H01L29/16;H01L29/06;H01L21/762;H01L21/265;H01L29/167;H01L29/78;H01L29/36;H01L21/324 |
主分类号 |
H01L29/66 |
代理机构 |
|
代理人 |
|
主权项 |
1. A semiconductor device, comprising:
a semiconductor substrate; and a field effect transistor formed on the semiconductor substrate, wherein the semiconductor substrate has: a first base substrate; a first semiconductor region of a first conductivity type formed on the first base substrate or in an upper layer part of the first base substrate; an insulating layer formed on the first semiconductor region; and a semiconductor layer formed on the insulating layer, the first base substrate is made of silicon, and the first semiconductor region is made of silicon carbide. |
地址 |
Tokyo JP |