发明名称 MIM CAPACITOR
摘要 Various embodiments provide an MIM capacitor and fabrication method thereof. An exemplary MIM capacitor can include a dielectric layer disposed over a substrate containing a conductive layer. The dielectric layer can include a groove to expose the conductive layer in the substrate. A first metal layer can be disposed on a bottom surface and a bottom portion of a sidewall surface of the groove. A top surface of the first metal layer on the sidewall surface of the groove can be lower than a top surface of the dielectric layer. A dielectric material layer can be disposed on the first metal layer and on a top portion of the sidewall surface of the groove. A second metal layer can be disposed on the dielectric material layer; and a third metal layer can be disposed on the second metal layer to fill the groove.
申请公布号 US2016087029(A1) 申请公布日期 2016.03.24
申请号 US201514959396 申请日期 2015.12.04
申请人 Semiconductor Manufacturing International (Shanghai) Corporation 发明人 HONG ZHONGSHAN
分类号 H01L49/02 主分类号 H01L49/02
代理机构 代理人
主权项
地址 Shanghai CN