发明名称 APPARATUS AND METHODS TO CREATE A DOPED SUB-STRUCTURE TO REDUCE LEAKAGE IN MICROELECTRONIC TRANSISTORS
摘要 Transistor devices having a doped buffer or sub-structure between an active channel and a substrate. In one embodiment, a p-type dopant, such as magnesium, zinc, carbon, beryllium, and the like, may be introduced in the formation of the sub-structure, wherein the dopant may act as a p/n junction at the active channel to source and drain interfaces and decrease the off-state leakage path. In another embodiment, the material used for the formation of the doped substructure may be substantially the same as the material, without the dopant, used for the formation of the active channel, such that no heterojunction will be formed which could result in crystalline imperfections.
申请公布号 WO2016043775(A1) 申请公布日期 2016.03.24
申请号 WO2014US56564 申请日期 2014.09.19
申请人 INTEL CORPORATION;MOHAPATRA, CHANDRA S.;MURTHY, ANAND S.;GLASS, GLENN S.;GHANI, TAHIR;RACHMADY, WILLY;DEWEY, GILBERT;METZ, MATTHEW V.;KAVALIEROS, JACK T. 发明人 MOHAPATRA, CHANDRA S.;MURTHY, ANAND S.;GLASS, GLENN S.;GHANI, TAHIR;RACHMADY, WILLY;DEWEY, GILBERT;METZ, MATTHEW V.;KAVALIEROS, JACK T.
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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