| 摘要 |
PROBLEM TO BE SOLVED: To prevent a product yield from being decreased by undesirable characteristic deterioration, caused by a BT test, of a driver or a like that does not need to be deteriorated.SOLUTION: In conducting a BT test, a BT voltage is applied to a driver of a memory cell array in an only limited partial period in a period defined by a set command and a reset command, thereby allowing prevention of deterioration of a transistor included in the driver.SELECTED DRAWING: Figure 2 |
