发明名称 |
Method for Disconnecting Polysilicon Stringers During Plasma Etching |
摘要 |
A method of fabricating wordlines in semiconductor memory structures is disclosed that eliminates stringers between wordlines while maintaining a stable distribution of threshold voltage. A liner is deposited before performing a wordline etch, and a partial wordline etch is then performed. Remaining portions of the liner are removed, and the wordline etch is completed to form gates having vertical or tapered profiles. |
申请公布号 |
US2016086806(A1) |
申请公布日期 |
2016.03.24 |
申请号 |
US201414493608 |
申请日期 |
2014.09.23 |
申请人 |
Macronix International Co., Ltd. |
发明人 |
Lee Ching-Hsiung;Tsai Shih-Chang |
分类号 |
H01L21/28;H01L27/115;H01L29/792 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
Hsinchu TW |