发明名称 Method for Disconnecting Polysilicon Stringers During Plasma Etching
摘要 A method of fabricating wordlines in semiconductor memory structures is disclosed that eliminates stringers between wordlines while maintaining a stable distribution of threshold voltage. A liner is deposited before performing a wordline etch, and a partial wordline etch is then performed. Remaining portions of the liner are removed, and the wordline etch is completed to form gates having vertical or tapered profiles.
申请公布号 US2016086806(A1) 申请公布日期 2016.03.24
申请号 US201414493608 申请日期 2014.09.23
申请人 Macronix International Co., Ltd. 发明人 Lee Ching-Hsiung;Tsai Shih-Chang
分类号 H01L21/28;H01L27/115;H01L29/792 主分类号 H01L21/28
代理机构 代理人
主权项
地址 Hsinchu TW