| 摘要 |
Disclosed is an apparatus, for measuring a three-dimensional shape, which can be assembled onto a stereo microscope having two or more light paths, the apparatus for measuring a three-dimensional shape comprising: a patterned light irradiating unit, attached at the end of a first light path of the stereo microscope, for irradiating patterned light on an object to be measured by means of the first light path; and an image detection unit, attached at the end of a second light path of the stereo microscope, for analyzing the reflected light reflected from the object to be measured and received by means of the second light path. |
