发明名称 |
VARIABLE RESISTANCE MEMORY |
摘要 |
A variable resistance memory according to one embodiment of the present invention is provided with: a semiconductor layer (AA1); a gate electrode (27) that covers the upper surface and the lateral surface of the semiconductor layer (AA1); a first conductive line (SLj) that is connected to a first end of the semiconductor layer (AA1); a variable resistance element (MTJ) that is connected to a second end of the semiconductor layer (AA1); a second conductive line (BLj) that is connected to the variable resistance element (MTJ); and a third conductive line (WLi) that is connected to the gate electrode (27). The first and second conductive lines (SLj, BLj) are arranged between the semiconductor layer (AA1) and the third conductive line (WLi). |
申请公布号 |
WO2016042880(A1) |
申请公布日期 |
2016.03.24 |
申请号 |
WO2015JP68824 |
申请日期 |
2015.06.30 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
TANAKA, CHIKA;NOGUCHI, HIROKI;FUJITA, SHINOBU |
分类号 |
H01L21/8246;H01L27/105;H01L29/82;H01L43/08 |
主分类号 |
H01L21/8246 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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