发明名称 |
NON-VOLATILE RESISTIVE RANDOM ACCESS MEMORY CROSSBAR DEVICES WITH MAXIMIZED MEMORY ELEMENT DENSITY AND METHODS OF FORMING THE SAME |
摘要 |
Non-volatile resistive random access memory crossbar devices and methods of fabricating the same are provided herein. In an embodiment, a non-volatile resistive random access memory crossbar device includes a crossbar array including a bitline and a wordline. A hardmask that includes dielectric material is disposed over the bitline. The hardmask and the bitline include a first sidewall. A memory element layer and a selector layer are disposed in overlying relationship on the first sidewall of the bitline and hardmask. The memory element layer and a selector layer are further disposed between the bitline and the wordline, to form a first memory element and selector pair. |
申请公布号 |
US2016087197(A1) |
申请公布日期 |
2016.03.24 |
申请号 |
US201514858387 |
申请日期 |
2015.09.18 |
申请人 |
GLOBALFOUNDRIES Singapore Pte. Ltd. |
发明人 |
Tran Xuan Anh;Toh Eng Huat;Quek Elgin Kiok Boone |
分类号 |
H01L45/00;H01L27/24 |
主分类号 |
H01L45/00 |
代理机构 |
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代理人 |
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主权项 |
1. A non-volatile resistive random access memory crossbar device comprising:
a crossbar array comprising a bitline and a wordline; a hardmask comprising dielectric material and disposed over the bitline, wherein the hardmask and the bitline comprise a first sidewall; and a memory element layer and a selector layer disposed in overlying relationship on the first sidewall of the bitline and hardmask, and further disposed between the bitline and the wordline, to form a first memory element and selector pair. |
地址 |
Singapore SG |