发明名称 メモリセル、係るメモリセルを含む半導体デバイス構造、システム、および製作の方法
摘要 Memory cells including cell cores having free regions are disclosed. The free regions exhibit a strain that affects a magnetization orientation within the cell core. A stressor structure may exert a stress upon at least a portion of the cell core to effect the strain state of the free region. Also disclosed are semiconductor device structures and systems including such memory cells as well as methods for forming such memory cells.
申请公布号 JP5892575(B2) 申请公布日期 2016.03.23
申请号 JP20150501917 申请日期 2013.03.21
申请人 マイクロン テクノロジー, インク. 发明人 サンデュ,ガーテ エス.;キニー,ウェイン アイ.
分类号 H01L21/8246;H01L27/105;H01L29/82;H01L43/08 主分类号 H01L21/8246
代理机构 代理人
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