METHOD FOR THE DETECTION OF DEFECTS IN GAS-BARRIER FILMS USING QUANTUM DOTS

摘要

By forming nanoparticles from gas-phase precursors within cracks or defects in a gas-barrier film, crack-width may be determined from the diameter of the nanoparticles formed within. The optical absorption and emission wavelengths of a quantum dot are governed by the particle size. For a particular material, the absorption and/or emission wavelengths may therefore be correlated to the particle size (as determined from techniques such as transmission electron microscopy, TEM). Thus, fluorescence measurement techniques and/or confocal microscopy may be used to determine the size of quantum dots formed within a gas-barrier film, allowing both the size and nature of a defect to be determined. The method may be used to assess the potential effects of defects on the integrity of the gas-barrier film.