发明名称 被処理体の処理装置及び被処理体の載置台
摘要 A time-based change of plasma distribution is suppressed, and an object to be processed is evenly processed. An electrostatic chuck (11) which mounts a wafer, and a mounting table (2) including a focus ring (10) on an outer circumference surface of the electrostatic chuck (11) comprises a pressing member (12) which pressurizes the focus ring (10) for the electrostatic chuck (11), and a screw (52) which fixates the pressing member (12) on the electrostatic chuck (11). A coupling groove (10a) which is recessed toward a center direction of the focus ring (10) is formed all over the whole circumference of the outer side of the focus ring (10). A contact part (12a) of the pressing member (12) is coupled with the coupling groove (10a). A shading part (10b) which covers the contact part (12a) which does not see in a plane view is formed on the upper side of the outer circumference end of the focus ring (10).
申请公布号 JP5893516(B2) 申请公布日期 2016.03.23
申请号 JP20120140550 申请日期 2012.06.22
申请人 東京エレクトロン株式会社 发明人 内田 陽平;松浦 淳
分类号 H01L21/3065;H01L21/205;H01L21/31;H05H1/46 主分类号 H01L21/3065
代理机构 代理人
主权项
地址