发明名称 Semiconductor structure including stacked structure and method for forming the same
摘要 A semiconductor structure and a method for forming the same are provided. The semiconductor structure includes a substrate, a stacked structure, a dielectric layer, a conductive structure, a dielectric structure and a conductive plug. The stacked structure includes dielectric films and conductive films arranged alternately. The dielectric layer is between the conductive structure and a sidewall of the stacked structure. The dielectric structure is on the stacked structure and defining a through via. The conductive plug fills the through via and physically contacts one of the conductive films exposed by the through via and adjoined with the dielectric layer.
申请公布号 US9293348(B2) 申请公布日期 2016.03.22
申请号 US201314143040 申请日期 2013.12.30
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 Lai Erh-Kun;Lee Guan-Ru;Shih Yen-Hao
分类号 H01L23/528;H01L27/105;H01L23/522;H01L21/3213;H01L21/3205;H01L21/768;H01L29/792;H01L27/115;H01L29/423;H01L29/66 主分类号 H01L23/528
代理机构 McClure, Qualey & Rodack, LLP 代理人 McClure, Qualey & Rodack, LLP
主权项 1. A semiconductor structure, comprising: a substrate; a stacked structure comprising dielectric films and conductive films arranged alternately; a dielectric layer; a conductive structure, the dielectric layer being between the conductive structure and a sidewall of the stacked structure; a dielectric structure on the stacked structure and defining a through via; and at least one conductive plug, wherein the conductive plug fills the through via and physically contacting a first portion of one of the conductive films exposed by the through via and adjoined with the dielectric layer.
地址 Hsinchu TW
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