Non-intrusive passive intermodulation testing

摘要

A passive intermodulation test device includes a first signal generator that generates a first signal and a second signal generator that generates a second signal. A combiner combines the first signal and the second signal to generate a combined signal. A duplexer receives a test signal based, at least in part, on the combined signal and filters the first signal and the second signal from the test signal to generate an intermodulation signal. A variable low-noise amplifier amplifies the intermodulation signal in accordance with a variable gain based at least in part on a selected power level. A receiver, upon receipt of the intermodulation signal, measures intermodulation generated by a device under test.

主权项

1. A passive intermodulation test device comprising:
a first signal generator configured to generate a first signal; a second signal generator configured to generate a second signal; a first combiner configured to combine the first signal and the second signal to generate a combined signal, and to provide the combined signal directly to an unduplexed device under test; a second combiner configured to combine the first signal and the second signal to generate a combined signal; a first duplexer configured to receive a test signal from the unduplexed device under test based at least in part on the combined signal from the first combiner, and wherein the first duplexer is configured to filter the first signal and the second signal from the test signal to generate an intermodulation signal; a second duplexer configured to receive the combined signal from the second combiner, and to transmit the combined signal to a duplexed device under test; a variable low-noise amplifier in communication with the first duplexer and configured to amplify the intermodulation signal in accordance with a variable gain based at least in part on a selected power level; and a receiver in communication with the variable low-noise amplifier and configured to receive the intermodulation signal and measure intermodulation generated by the unduplexed device under test.