Operating surface characterization for integrated circuits

摘要

A device includes an integrated circuit programmed with an operating surface equation. The operating surface equation may define an operating point as a function of operating voltage, operating frequency, and leakage current. The operating surface equation may be generated by fitting a surface equation to data for operating voltage and operating frequency versus leakage current for a plurality of test integrated circuits. An operating voltage of the integrated circuit at a given operating frequency may be determined by the operating surface equation and a leakage current value fused into the device.

主权项

1. A device, comprising:
an integrated circuit programmed with an operating surface equation that defines an operating point as a function of operating voltage, operating frequency, and leakage current, wherein the operating surface equation is generated prior to manufacture of the integrated circuit, the operating surface equation is generated by fitting a surface equation to data for operating voltage and operating frequency versus leakage current for a plurality of test integrated circuits; wherein an operating voltage of the integrated circuit at a given operating frequency is determined by the integrated circuit evaluating the operating surface equation at the given operating frequency and at least one leakage current value fused into the device, wherein the leakage current value is determined during a test of the integrated circuit.