发明名称 |
DEFECT DETECTION METHOD FOR THERMISTOR ELEMENT |
摘要 |
PROBLEM TO BE SOLVED: To provide a defect detection method for a thermistor element capable of efficiently detecting an internal defect within a thermistor.SOLUTION: The defect detection method includes the steps of: measuring a frequency response property of impedance; creating a Cole-Cole plot with a real number component R as a transverse axis and an imaginary number component X as a vertical axis; defining the real number component R in a low frequency lower limit of a curve obtained in the plot as Rmax and calculating a semicircle of a virtual circle of which the center is (Rmax/2, 0) and which is approximate to the curve; calculating a degree of distortion of the curve obtained in the plot from the semicircle as a distortion rate; setting a minimum distortion rate under the presence of the internal defect as a reference value on the basis of correlation data between the distortion rate that is calculated by measuring a plurality of elements beforehand and the presence/absence of the internal defect in an element assembly; and determining the presence of the internal defect in the element assembly in the case where the calculated distortion rate is greater than the reference value.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016039376(A) |
申请公布日期 |
2016.03.22 |
申请号 |
JP20150156259 |
申请日期 |
2015.08.06 |
申请人 |
MITSUBISHI MATERIALS CORP |
发明人 |
FUJIWARA KAZUTAKA;NAGATOMO KENSHO;INUI SHINICHIRO |
分类号 |
H01C7/04;H01C7/02 |
主分类号 |
H01C7/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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