| 摘要 |
PROBLEM TO BE SOLVED: To detect an abnormality sign of an object plant device, estimate an abnormality factor and track the abnormality sign.SOLUTION: Reference data which is obtained from reference measurement for measuring a system parameter and a mechatronics parameter of an object plant device during constant load time, is normalized, then a characteristic coefficient is extracted from time series of the normalized reference data. Then, a reference score is determined based on the characteristic coefficient and normalized reference data, the system parameter and mechatronics parameter at a monitor object time point are measured. Then, object data obtained from the object measurement is normalized, then an object score is determined based on the normalized object data and characteristic coefficient. Then, by comparing magnitude of difference between the reference score and object score, and a preset threshold, presence/absence of an abnormality is determined. When it is determined that there is an abnormality, based on comparison between each reference score and object score to each of the system parameter and mechatronics parameter, a parameter related to a factor of the abnormality is extracted.SELECTED DRAWING: Figure 1 |
