发明名称 Hybrid fin field-effect transistor structures and related methods
摘要 Semiconductor-on-insulator structures facilitate the fabrication of devices, including MOSFETs that are at least partially depleted during operation and FinFETs including bilayer fins and/or crystalline oxide.
申请公布号 US9293582(B2) 申请公布日期 2016.03.22
申请号 US201514671729 申请日期 2015.03.27
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Currie Matthew T.
分类号 H01L29/76;H01L29/78;H01L21/8238;H01L21/84;H01L27/12;H01L29/66;H01L27/092;H01L29/786 主分类号 H01L29/76
代理机构 Slater & Matsil, L.L.P. 代理人 Slater & Matsil, L.L.P.
主权项 1. A device comprising: a substrate; an insulator layer over the substrate; and a complementary device comprising a first device in a first region of the substrate and a second device in a second region of the substrate, the first device comprising: a first portion of a first strained layer over and contacting the insulator layer in the first region of the substrate, the first strained layer being strained a first strain type,a first gate structure over the first portion of the first strained layer, the first gate structure defining a first channel region in the first portion of the first strained layer, anda first source/drain region and a second source/drain region disposed on opposite sides of the first gate structure, andthe second device comprising: a second portion of the first strained layer over and contacting the insulator layer in the second region of the substrate;a second strained layer over the second portion of the first strained layer in the second region of the substrate, the second strained layer being strained a second strain type different from the first strain type,a second gate structure over the second strained layer, the second gate structure defining a second channel region in the second strained layer, anda third source/drain region and a fourth source/drain region disposed on opposite sides of the second gate structure.
地址 Hsin-Chu TW