发明名称 |
Semiconductor device and method for fabricating the same, and microprocessor, processor, system, data storage system and memory system including the semiconductor device |
摘要 |
A semiconductor device includes first lines extending in a first direction; second lines extending in a second direction crossing with the first direction; and first resistance variable elements defined between the first lines and the second lines and each including a first substance layer and a second substance layer, wherein the first substance layer extends in the first direction and the second substance layer extends in the second direction. |
申请公布号 |
US9293705(B2) |
申请公布日期 |
2016.03.22 |
申请号 |
US201514877781 |
申请日期 |
2015.10.07 |
申请人 |
SK HYNIX INC. |
发明人 |
Choi Hye-Jung;Chung Su-Ock |
分类号 |
H01L45/00;H01L27/24 |
主分类号 |
H01L45/00 |
代理机构 |
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代理人 |
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主权项 |
1. A method for fabricating a semiconductor device, comprising:
forming first structures over a substrate which extend in a first direction, the first structures comprising first lines and a first substance layer in a stacked configuration; and forming second structures which extend in a second direction crossing with the first direction, the second structures comprising second lines and a second substance layer in a stacked configuration; wherein a plurality of resistance variable elements are defined between the first lines and the second lines at crossing regions between the first substance layer and the second substance layer. |
地址 |
Icheon KR |