发明名称 Semiconductor device and method for fabricating the same, and microprocessor, processor, system, data storage system and memory system including the semiconductor device
摘要 A semiconductor device includes first lines extending in a first direction; second lines extending in a second direction crossing with the first direction; and first resistance variable elements defined between the first lines and the second lines and each including a first substance layer and a second substance layer, wherein the first substance layer extends in the first direction and the second substance layer extends in the second direction.
申请公布号 US9293705(B2) 申请公布日期 2016.03.22
申请号 US201514877781 申请日期 2015.10.07
申请人 SK HYNIX INC. 发明人 Choi Hye-Jung;Chung Su-Ock
分类号 H01L45/00;H01L27/24 主分类号 H01L45/00
代理机构 代理人
主权项 1. A method for fabricating a semiconductor device, comprising: forming first structures over a substrate which extend in a first direction, the first structures comprising first lines and a first substance layer in a stacked configuration; and forming second structures which extend in a second direction crossing with the first direction, the second structures comprising second lines and a second substance layer in a stacked configuration; wherein a plurality of resistance variable elements are defined between the first lines and the second lines at crossing regions between the first substance layer and the second substance layer.
地址 Icheon KR