| 摘要 |
PROBLEM TO BE SOLVED: To efficiently detect fine particles in a sample at a high speed.SOLUTION: A fine particle detection device comprises: a sample chip (7) having a sample injection part into which a sample including fine particles is injected; a light source (8); an irradiation optical system (1) which irradiates the sample with light from the light source (8); an optical detection optical system which detects light emitted from the fine particles in response to the irradiation with the light; and a detection part which detects the fine particles based upon intensity of the light from the fine particles. The optical detection optical system includes an objective lens element (2) which while transmitting the light from the light source (8) toward the sample, converges the light emitted from the fine particles, and the objective lens element (2) includes a beam light transmission part so shaped as to converge the light from the light source (8) toward the sample, D≤λ/Rholding for a thickness D of the sample injection part, a wavelength λ of the irradiation light from the light source (8), and a decrease rate R of a beam radius of the irradiation light at the beam light transmission part.SELECTED DRAWING: Figure 1 |
