发明名称 |
Cyclic redundancy check circuit and semiconductor device having the cyclic redundancy check circuit |
摘要 |
An object of the present invention is to provide a CRC circuit with more simple structure and low power consumption. The CRC circuit includes a first shift register to a p-th shift register, a first EXOR to a (p−1)th EXOR, and a switching circuit. A data signal, a select signal, and an output of a last stage of the p-th shift register are inputted to the switching circuit, and the switching circuit switches a first signal or a second signal in response to the select signal to be outputted. |
申请公布号 |
US9294126(B2) |
申请公布日期 |
2016.03.22 |
申请号 |
US201514679148 |
申请日期 |
2015.04.06 |
申请人 |
Semiconductor Energy Laboratory Co., Ltd. |
发明人 |
Ito Masafumi;Atsumi Tomoaki |
分类号 |
H03M13/00;H03M13/09;H04B1/10 |
主分类号 |
H03M13/00 |
代理机构 |
Fish & Richardson P.C. |
代理人 |
Fish & Richardson P.C. |
主权项 |
1. A system including a semiconductor device, comprising:
a semiconductor device implanted into a creature, the semiconductor device comprising:
an antenna; anda circuit portion configured to transmit a signal to the antenna and to receive a signal from the antenna, the circuit portion comprising a cyclic redundancy check circuit and a memory circuit, the memory circuit comprising:
a first transistor;a first invertor comprising a second transistor and a third transistor, and a second invertor comprising a fourth transistor and a fifth transistor, each of the first invertor and the second invertor being electrically connected to the first transistor; anda sixth transistor electrically connected to the first invertor and the second invertor, wherein at least one of the first to sixth transistors comprises a semiconductor layer comprising a channel forming region, and wherein the channel forming region comprises a metal oxide semiconductor. |
地址 |
Kanagawa-ken JP |