发明名称 Cyclic redundancy check circuit and semiconductor device having the cyclic redundancy check circuit
摘要 An object of the present invention is to provide a CRC circuit with more simple structure and low power consumption. The CRC circuit includes a first shift register to a p-th shift register, a first EXOR to a (p−1)th EXOR, and a switching circuit. A data signal, a select signal, and an output of a last stage of the p-th shift register are inputted to the switching circuit, and the switching circuit switches a first signal or a second signal in response to the select signal to be outputted.
申请公布号 US9294126(B2) 申请公布日期 2016.03.22
申请号 US201514679148 申请日期 2015.04.06
申请人 Semiconductor Energy Laboratory Co., Ltd. 发明人 Ito Masafumi;Atsumi Tomoaki
分类号 H03M13/00;H03M13/09;H04B1/10 主分类号 H03M13/00
代理机构 Fish & Richardson P.C. 代理人 Fish & Richardson P.C.
主权项 1. A system including a semiconductor device, comprising: a semiconductor device implanted into a creature, the semiconductor device comprising: an antenna; anda circuit portion configured to transmit a signal to the antenna and to receive a signal from the antenna, the circuit portion comprising a cyclic redundancy check circuit and a memory circuit, the memory circuit comprising: a first transistor;a first invertor comprising a second transistor and a third transistor, and a second invertor comprising a fourth transistor and a fifth transistor, each of the first invertor and the second invertor being electrically connected to the first transistor; anda sixth transistor electrically connected to the first invertor and the second invertor, wherein at least one of the first to sixth transistors comprises a semiconductor layer comprising a channel forming region, and wherein the channel forming region comprises a metal oxide semiconductor.
地址 Kanagawa-ken JP