发明名称 Compound-barrier infrared photodetector
摘要 Using a multiple layer, varied composition barrier layer in place of the typical single layer barrier layer of an infrared photodetector results in a device with increased sensitivity and reduced dark current. A first barrier is adjacent the semiconductor contact; a second barrier layer is between the first barrier layer and the absorber layer. The barrier layers may be doped N type or P type with Beryllium, Carbon, Silicon or Tellurium. The energy bandgap is designed to facilitate minority carrier current flow in the contact region and block minority current flow outside the contact region.
申请公布号 US9293612(B1) 申请公布日期 2016.03.22
申请号 US201414453772 申请日期 2014.08.07
申请人 HRL Laboratories, LLC 发明人 De Lyon Terence J;Rajavel Rajesh D;Sharifi Hasan
分类号 H01L31/102;H01L31/101;H01L31/111;H01L31/0304;H01L31/0296;H01L31/0352;H01L31/109 主分类号 H01L31/102
代理机构 代理人 Rapacki George R.;Wu Albert T.
主权项 1. A compound barrier infrared photodetector comprising: a photo absorber layer responsive to infrared light; a first barrier layer of a first semiconductor material disposed on the absorber layer; a second barrier layer of a second semiconductor material disposed on the first barrier layer; a third barrier layer of a third semiconductor material disposed on the second barrier layer; a contact layer disposed on the third barrier layer; wherein the third semiconductor material comprises an aluminum alloy with aluminum cation fraction less than 80%.
地址 Malibu CA US