发明名称 Three terminal fuse with FinFET
摘要 A technique is provided for programming a transistor having a source, a drain, a gate, and a channel region between the source and the drain. The gate is above dielectric above the channel region. A gate voltage is about equal to or greater than a breakdown voltage of the gate dielectric in order to break down the gate dielectric into a breakdown state. Current flows between the source and the drain as a result of breaking down the gate dielectric. In response to the transistor being programmed, the current flowing between the source and the drain is not based on the gate voltage at the gate.
申请公布号 US9293221(B1) 申请公布日期 2016.03.22
申请号 US201514632017 申请日期 2015.02.26
申请人 International Business Machines Corporation 发明人 Liu Derrick;Yeh Chun-Chen
分类号 G11C17/00;G11C17/18;G11C17/16 主分类号 G11C17/00
代理机构 Cantor Colburn LLP 代理人 Cantor Colburn LLP ;Alexanian Vazken
主权项 1. A programmed circuit comprising: a plurality of transistors in an arrangement, each of the plurality of transistors having a source, a drain, and a gate, wherein a channel region is between the source and the drain, wherein a gate dielectric is at least one of above the channel region and wrapped around the channel region; a programmed set of the plurality of transistors having been programmed, wherein the programmed set of the plurality of transistors has the gate dielectric that is broken down in response to applying a gate voltage about equal to or greater than a breakdown voltage of the gate dielectric; and an unprogrammed set of the plurality of transistors not having been programmed, wherein the unprogrammed set of the plurality of transistors have the gate dielectric that has not been broken down.
地址 Armonk NY US