发明名称 FINE PARTICLE DETECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To reduce the amount of data when detecting fine particles from a sample and counting them.SOLUTION: A fine particle detection device comprises: an irradiation optical system (1) which irradiates a sample (7) with light from light sources (8, 12); optical detection optical systems (3, 4) which detect light from fine particles in the sample (7); and a detection part which detects the fine particles based upon intensities of the light detected by the optical detection optical systems (3, 4). The irradiation optical system (1) and the optical detection optical systems(3, 4) scan the sample (7) relatively in two dimensions along a first scanning direction and a second scanning direction crossing it, and the detection part determines a presence region where the fine particles are present for each scanning line based upon intensities from light from the fine particles when the irradiation optical system (1) and the optical detection optical systems(3, 4) scan the sample in the first scanning direction and compares presence regions on mutually adjacent scanning lines with each other so as to determine whether a pair of presence regions on both the scanning lines is based upon the same fine particle.SELECTED DRAWING: Figure 1
申请公布号 JP2016038359(A) 申请公布日期 2016.03.22
申请号 JP20140163766 申请日期 2014.08.11
申请人 SHARP CORP 发明人 OKABASHI TETSUYOSHI;TANAKA YUUKI
分类号 G01N15/02 主分类号 G01N15/02
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