发明名称 Solar cell structure and method for fabricating the same
摘要 A solar cell structure with a microsphere-roughened antireflection structure comprises a P-type metal contact electrode, a P-type semiconductor layer, a P-type monocrystalline substrate, an N-type semiconductor layer, an N-type metal contact electrode, and a microsphere-roughened antireflection layer. The N-type semiconductor layer and the P-type semiconductor layer are respectively arranged on an upper surface and a lower surface of the P-type monocrystalline substrate. The P-type metal contact electrode is arranged below the P-type semiconductor layer. The N-type metal contact electrode has a specified pattern and is connected with the N-type semiconductor layer. The microsphere-roughened antireflection layer is arranged on an upper surface of the N-type semiconductor layer without covering the N-type metal contact electrode. The microsphere-roughened antireflection layer reduces the reflection of sunlight and increases the transmittance of sunlight to enhance the efficiency of solar cells.
申请公布号 US9293611(B1) 申请公布日期 2016.03.22
申请号 US201414495048 申请日期 2014.09.24
申请人 Huey-Liang Hwang 发明人 Hwang Huey-Liang;Lin Jian-Yang;Hu Cheng-Siang;Li Chao-Chang
分类号 H01L31/0216;H01L31/18;H01L31/0236 主分类号 H01L31/0216
代理机构 Muncy, Geissler, Olds & Lowe, P.C. 代理人 Muncy, Geissler, Olds & Lowe, P.C.
主权项 1. A method for fabricating a solar cell structure with a microsphere-roughened antireflection structure, the solar cell structure with the microsphere-roughened antireflection structure comprising: a P-type monocrystalline substrate; a N-type semiconductor layer and a P-type semiconductor that are respectively arranged on an upper surface and a lower surface of the P-type monocrystalline substrate; a P-type metal contact electrode arranged below the P-type semiconductor layer; a N-type metal contact electrode having a specified pattern and connected with the N-type semiconductor layer; a microsphere-roughened antireflection layer arranged on an upper surface of the N-type semiconductor layer without covering the N-type metal contact electrode; and a surface passivation layer arranged on the upper surface of the N-type semiconductor layer, wherein the N-type metal contact electrode passes through the surface passivation layer to connect with the N-type semiconductor layer, wherein the surface passivation layer is fabricated on the upper surface of the N-type semiconductor layer beforehand; next, the N-type metal contact electrode having the specified pattern is fabricated on an upper surface of the surface passivation layer; next, a baking process is undertaken to make the N-type metal contact electrode pass through the surface passivation layer to connect with the N-type semiconductor layer; next, the microsphere-roughened antireflection layer is fabricated on the upper surface of the surface passivation layer, without covering the N-type metal contact electrode.
地址 Hsinchu TW