发明名称 |
Semiconductor apparatus and manufacturing method of the same |
摘要 |
A semiconductor apparatus including a first stacked structure and a second stacked structure is provided. The first stacked structure and the second stacked structure are arranged along a first direction, and extended along a second direction perpendicular to the first direction. The first stacked structure includes a first operating portion and a first supporting portion. The first operating portion and the first supporting portion are alternately arranged along the second direction. A width of the first operating portion along the first direction is smaller than a width of the first supporting portion along the first direction. |
申请公布号 |
US9293471(B1) |
申请公布日期 |
2016.03.22 |
申请号 |
US201414524066 |
申请日期 |
2014.10.27 |
申请人 |
MACRONIX INTERNATIONAL CO., LTD. |
发明人 |
Chen Shih-Hung |
分类号 |
H01L21/336;H01L27/115;H01L21/28;H01L21/306;H01L21/311;H01L29/49;H01L21/768;H01L29/792 |
主分类号 |
H01L21/336 |
代理机构 |
McClure, Qualey & Rodack, LLP |
代理人 |
McClure, Qualey & Rodack, LLP |
主权项 |
1. A semiconductor apparatus comprising a first stacked structure and a second stacked structure arranged along a first direction and extended along a second direction perpendicular to the first direction, and a dielectric structure disposed on surfaces of the first stacked structure and the second stacked structure, the first stacked structure comprising:
a first operating portion; and a first supporting portion alternately arranged with the first operating portion along the second direction; and the second stacked structure comprising: a second operating portion disposed adjacent to the first operating portion along the first direction; and a second supporting portion alternately arranged with the second operating portion along the second direction, and disposed adjacent to the first supporting portion along the first direction; wherein a width of the first operating portion along the first direction is smaller than a width of the first supporting portion along the first direction; a width of the second operating portion along the first direction is smaller than a width of the second supporting portion along the first direction; a first trench is disposed between the first operating portion and the second operating portion, and a second trench is disposed between the first supporting portion and the second supporting portion on the longitudinal sectional view of the first stacked structure and the second stacked structure; and the dielectric structure is filled in the second trench and is a multi-layer structure comprising a tunneling layer and a trapping layer. |
地址 |
Hsinchu TW |