发明名称 |
SILICIDE REGION OF GATE-ALL-AROUND TRANSISTOR |
摘要 |
The disclosure relates to a semiconductor device. An exemplary structure for a semiconductor device comprises: a substrate; a nanowire structure protruding from the substrate comprising a channel region between a source region and a drain region; a pair of silicide regions extending into opposite sides of the source region, wherein each of the pair of silicide regions comprises a vertical portion adjacent to the source region and a horizontal portion adjacent to the substrate; and a metal gate surrounding a portion of the channel region. |
申请公布号 |
KR20160031428(A) |
申请公布日期 |
2016.03.22 |
申请号 |
KR20150128198 |
申请日期 |
2015.09.10 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
CHING KUO CHENG;LIU CHI WEN;WANG CHAO HSIUNG |
分类号 |
H01L29/423;H01L21/02;H01L21/28;H01L29/06;H01L29/66 |
主分类号 |
H01L29/423 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|