发明名称 SILICIDE REGION OF GATE-ALL-AROUND TRANSISTOR
摘要 The disclosure relates to a semiconductor device. An exemplary structure for a semiconductor device comprises: a substrate; a nanowire structure protruding from the substrate comprising a channel region between a source region and a drain region; a pair of silicide regions extending into opposite sides of the source region, wherein each of the pair of silicide regions comprises a vertical portion adjacent to the source region and a horizontal portion adjacent to the substrate; and a metal gate surrounding a portion of the channel region.
申请公布号 KR20160031428(A) 申请公布日期 2016.03.22
申请号 KR20150128198 申请日期 2015.09.10
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 CHING KUO CHENG;LIU CHI WEN;WANG CHAO HSIUNG
分类号 H01L29/423;H01L21/02;H01L21/28;H01L29/06;H01L29/66 主分类号 H01L29/423
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