发明名称 |
OPTICAL INSPECTION METHOD OF DISPLAY CELL HAVING FLEXIBLE THIN FILM STRUCTURE, AND PSEUDO TERMINAL UNIT USED FOR THE METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide an inspection method for performing defect inspection of display cells having a flexible thin film structure formed on a resin substrate in an excitation state without laminating a protective film on the display cells.SOLUTION: An optical inspection method of display cells 1 having a flexible thin film structure includes the steps of: feeding a mother board structure including at least a resin substrate 4 and a cell mother board formed on the resin substrate 4 and comprises at least one display cell 1 having a flexible thin film structure and a display surface, in a feeding direction while the display surface of the display cell 1 is directed upward; forming an adhesive layer on the display surface of the display cell 1 of the mother board structure that is fed in the feeding direction; supplying an excitation power to the display cell 1 having the adhesive layer formed on its display surface to excite the display cell 1 and performing defect inspection on the display cell in an excitation state; and laminating an optical functional film onto the adhesive layer formed on the display surface of the display cell 1 after the defect inspection.SELECTED DRAWING: Figure 5 |
申请公布号 |
JP2016035409(A) |
申请公布日期 |
2016.03.17 |
申请号 |
JP20140158104 |
申请日期 |
2014.08.01 |
申请人 |
NITTO DENKO CORP |
发明人 |
NAKANISHI TADATOSHI;JO SOYA;KOSHIO SATOSHI;MURAKAMI NAO |
分类号 |
G01N21/956;G01N21/892;H01L51/50;H05B33/02;H05B33/06;H05B33/12 |
主分类号 |
G01N21/956 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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