发明名称 OPTICAL INSPECTION METHOD OF DISPLAY CELL HAVING FLEXIBLE THIN FILM STRUCTURE, AND PSEUDO TERMINAL UNIT USED FOR THE METHOD
摘要 PROBLEM TO BE SOLVED: To provide an inspection method for performing defect inspection of display cells having a flexible thin film structure formed on a resin substrate in an excitation state without laminating a protective film on the display cells.SOLUTION: An optical inspection method of display cells 1 having a flexible thin film structure includes the steps of: feeding a mother board structure including at least a resin substrate 4 and a cell mother board formed on the resin substrate 4 and comprises at least one display cell 1 having a flexible thin film structure and a display surface, in a feeding direction while the display surface of the display cell 1 is directed upward; forming an adhesive layer on the display surface of the display cell 1 of the mother board structure that is fed in the feeding direction; supplying an excitation power to the display cell 1 having the adhesive layer formed on its display surface to excite the display cell 1 and performing defect inspection on the display cell in an excitation state; and laminating an optical functional film onto the adhesive layer formed on the display surface of the display cell 1 after the defect inspection.SELECTED DRAWING: Figure 5
申请公布号 JP2016035409(A) 申请公布日期 2016.03.17
申请号 JP20140158104 申请日期 2014.08.01
申请人 NITTO DENKO CORP 发明人 NAKANISHI TADATOSHI;JO SOYA;KOSHIO SATOSHI;MURAKAMI NAO
分类号 G01N21/956;G01N21/892;H01L51/50;H05B33/02;H05B33/06;H05B33/12 主分类号 G01N21/956
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