发明名称 DEVICE AND METHOD FOR MODULAR MATERIAL ANALYSIS FOR PLASTICS
摘要 The invention relates to a method and a device for modular material analysis for plastics, said device comprising at least two different measuring devices from the group: measuring devices for the optical measurement of a molten mass; measuring devices for filter pressure value testing; measuring devices for rheology; measuring devices for the optical inspection of films; measuring devices for mechanical characteristics of plastic films; measuring devices for colorimetry; measuring devices for the olfactory measurement of a molten mass or a film; and measuring devices for NIR, FTIR, TGA, terahertz radiation, gas chromatography and mass spectrometry, wherein the measuring devices in question are mechanically and/or functionally connected to one another.
申请公布号 WO2016037205(A1) 申请公布日期 2016.03.17
申请号 WO2015AT50218 申请日期 2015.09.09
申请人 NEXT GENERATION ANALYTICS GMBH 发明人 KASTNER, FRIEDRICH
分类号 B29C47/92;G01N11/04 主分类号 B29C47/92
代理机构 代理人
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