发明名称 DEVICE INSPECTING METHOD, PROBE CARD, INTERPOSER, AND INSPECTING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an inspection method that can efficiently perform an inspection in a short time when the electrical characteristics of plural devices are inspected.SOLUTION: A signal input/output circuit 33 has an input line 41, a common output line 51, a plurality of individual output lines 52, a relay switch unit 53, and a resistance element 54. The common output line 51 for combining and transmitting response signals from plural DUTs 10 is connected to a comparator 32. In response to a test signal transmitted from a pattern generator 31, the comparator 32 compares a threshold value with a composite response signal obtained by combining response signals output from the plural DUTs 10 into one signal.SELECTED DRAWING: Figure 2
申请公布号 JP2016035957(A) 申请公布日期 2016.03.17
申请号 JP20140157753 申请日期 2014.08.01
申请人 TOKYO ELECTRON LTD 发明人 KAGAMI TETSUYA;SUZUKI KANJI
分类号 H01L21/66;G01R31/28 主分类号 H01L21/66
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