| 摘要 |
PROBLEM TO BE SOLVED: To provide a device that has further developed a conventional art.SOLUTION: In a magnetic field measuring device, a first semiconductor substrate comprises two magnetic field sensors arranged on the surface of a first x-y plane with distance between them for measuring the z component of a magnetic field, a first magnet has a magnetization direction changing from the N pole to the S pole at a symmetry plane along a flat main extension surface of a second x-y plane, the first semiconductor substrate and the first magnet are firmly fixed to each other, the first semiconductor substrate is placed in parallel with displacement relative to the first magnet, and displacement in the z direction between the first x-y plane and the second x-y plane is smaller than the thickness of the first magnet in the z direction. One magnetic field sensor is placed in the vicinity of the N pole, and the other in the vicinity of the S pole; thereby, when the z component of the magnetic field of the first magnet occurs, the two magnetic field sensors generate a plurality of signals having opposite poles to each other.SELECTED DRAWING: Figure 1 |
