| 摘要 |
PROBLEM TO BE SOLVED: To solve the problem that, in a conventional semiconductor device, when either of CPU cores performing lock step operation is failed, the operation cannot be continued, and reliability cannot be improved.SOLUTION: In a semiconductor device having an operation part 10 including a first CPU core 11 and a second CPU core 12 performing lock step operation, each of the first CPU core 11 and the second CPU core 12 diagnoses fail of an internal logic circuit, and a sequence control circuit 16 switches the CPU core for outputting data to a sharing resource in the operation part, based on a diagnosis result.SELECTED DRAWING: Figure 2 |
