发明名称 SEMICONDUCTOR APPARATUS AND METHOD FOR FABRICATING THE SAME
摘要 A method for fabricating a semiconductor apparatus includes forming a variable resistor region, and forming a spacer having a top linewidth and a bottom linewidth substantially equal to each other in the variable resistor region. The forming of the spacer includes forming a first insulating layer in the variable resistor region through a first method, forming a second insulating layer along a surface of the first insulating layer in the variable resistor region through a second method for providing step coverage superior to the first method, and etching the first and second insulating layers.
申请公布号 US2016079525(A1) 申请公布日期 2016.03.17
申请号 US201414566305 申请日期 2014.12.10
申请人 SK hynix Inc. 发明人 YOON Jae Sung
分类号 H01L45/00;H01L27/24 主分类号 H01L45/00
代理机构 代理人
主权项 1. A method for fabricating a semiconductor apparatus, the method comprising: forming a variable resistor region; and forming a spacer having a substantially uniform width from a top to a bottom of the spacer in the variable resistor region, wherein the forming of the spacer includes: forming a first insulating layer in the variable resistor region through a first method; forming a second insulating layer over a surface of the first insulating layer in the variable resistor region through a second method, wherein the second method has step coverage superior to the first method; and etching the first and the second insulating layers.
地址 Gyeonggi-do KR