发明名称 |
SEMICONDUCTOR APPARATUS AND METHOD FOR FABRICATING THE SAME |
摘要 |
A method for fabricating a semiconductor apparatus includes forming a variable resistor region, and forming a spacer having a top linewidth and a bottom linewidth substantially equal to each other in the variable resistor region. The forming of the spacer includes forming a first insulating layer in the variable resistor region through a first method, forming a second insulating layer along a surface of the first insulating layer in the variable resistor region through a second method for providing step coverage superior to the first method, and etching the first and second insulating layers. |
申请公布号 |
US2016079525(A1) |
申请公布日期 |
2016.03.17 |
申请号 |
US201414566305 |
申请日期 |
2014.12.10 |
申请人 |
SK hynix Inc. |
发明人 |
YOON Jae Sung |
分类号 |
H01L45/00;H01L27/24 |
主分类号 |
H01L45/00 |
代理机构 |
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代理人 |
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主权项 |
1. A method for fabricating a semiconductor apparatus, the method comprising:
forming a variable resistor region; and forming a spacer having a substantially uniform width from a top to a bottom of the spacer in the variable resistor region, wherein the forming of the spacer includes: forming a first insulating layer in the variable resistor region through a first method; forming a second insulating layer over a surface of the first insulating layer in the variable resistor region through a second method, wherein the second method has step coverage superior to the first method; and etching the first and the second insulating layers. |
地址 |
Gyeonggi-do KR |