发明名称 ADHESION LAYER FOR INTERCONNECT STRUCTURE
摘要 Alternative methods of fabricating an interconnect structure having an adhesion layer, wherein the surfaces of the adhesion layer may be altered to correspond to the materials that are adhered to that surface.
申请公布号 US2016079172(A1) 申请公布日期 2016.03.17
申请号 US201414488446 申请日期 2014.09.17
申请人 International Business Machines Corporation 发明人 Yang Chih-Chao;Lin Wei;Spooner Terry A.;van der Straten Oscar
分类号 H01L23/532;H01L21/768 主分类号 H01L23/532
代理机构 代理人
主权项 1. A method of forming an interconnect structure, the method comprising: forming at least one opening into an interconnect dielectric material; forming a metal diffusion barrier liner on the interconnect dielectric material, wherein at least a portion of the metal diffusion barrier liner is inside of at least one opening, and wherein the metal diffusion barrier liner comprises a second metal; forming an adhesion layer on the metal diffusion barrier liner, wherein the adhesion barrier has a sufficiently similar lattice structure as the metal diffusion barrier liner, wherein the adhesion layer comprises a first metal, and wherein the first metal is different from the second metal; modifying the lattice structure on at least an exposed surface of the adhesion layer to a lattice structure having a different orientation; forming a conductive material on the adhesion layer, wherein the conductive material has the same lattice structure of the modified surface of the adhesion layer; and removing the conductive material, the adhesion layer and the metal diffusion barrier liner that are located outside of the at least one opening.
地址 Armonk NY US