发明名称 RADIATION MEASUREMENT APPARATUS AND RADIATION MEASUREMENT METHOD
摘要 A radiation measurement apparatus includes an array-type radiation detector and an information calculation unit which obtains information on energies detected by pixels of the detector and information on a pixel on which a radiation ray is incident. The information calculation unit includes an energy conversion unit which converts a detected signal of a pixel which is equal to or larger than a predetermined threshold value into a detected energy value, a judgment value calculation unit which obtains a judgment value used to judge whether Compton scattering has been generated in the pixel in accordance with the detected energy, a judgment unit which judges whether the Compton scattering has been generated in the pixel in accordance with the judgment value, and a determination unit which obtains information on a pixel on which a radiation ray is first incident in accordance with a result of the judgment performed by the judgment unit.
申请公布号 US2016077219(A1) 申请公布日期 2016.03.17
申请号 US201514853798 申请日期 2015.09.14
申请人 CANON KABUSHIKI KAISHA 发明人 Yasui Kouji
分类号 G01T1/20 主分类号 G01T1/20
代理机构 代理人
主权项 1. A radiation measurement apparatus including an array-type radiation detector having a plurality of pixels and an information calculation unit which obtains information on detected energies of the individual pixels from the radiation detector and information on a pixel on which a radiation ray is incident, wherein the information calculation unit includes an energy conversion unit configured to convert a detected signal of a pixel which is equal to or larger than a predetermined threshold value into a detected energy,a judgment value calculation unit configured to obtain a Compton scattering judgment value used to judge whether Compton scattering has been generated in the pixel in accordance with the detected energy,a scattering judgment unit configured to judge whether the Compton scattering has been generated in the pixel in accordance with the Compton scattering judgment value, andan incident pixel determination unit configured to obtain information on a pixel on which a radiation ray is first incident in accordance with a result of the judgment performed by the scattering judgment unit.
地址 Tokyo JP