发明名称 STRESS MEASURING SYSTEM
摘要 PROBLEM TO BE SOLVED: To solve the problem that accurate measurement of stress having a value in a wide range is difficult in stress measurement using a photoelastic body.SOLUTION: A stress measuring system has: a photoelastic body, stuck on a measuring object which is an object for measuring stress, containing a plurality of photoelastic layers, for reflecting incident light having a plurality of wavelengths by allowing passage through a different number of photoelastic layers corresponding to the wavelength of the light; and a stress measuring part for measuring stress applied onto the measuring object on the basis of light having each wavelength acquired by spectrally separating reflected light from the photoelastic body.SELECTED DRAWING: Figure 2
申请公布号 JP2016035421(A) 申请公布日期 2016.03.17
申请号 JP20140158544 申请日期 2014.08.04
申请人 NEC CORP 发明人 IMAI HIROSHI
分类号 G01L1/24 主分类号 G01L1/24
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