| 发明名称 |
SYSTEMS AND METHODS FOR FREQUENCY DOMAIN CALIBRATION AND CHARACTERIZATION |
| 摘要 |
A system for assigning a characterization and calibrating a parameter is disclosed. The system includes a frequency measurement circuit and a finite state machine. The frequency measurement circuit is configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies. The finite state machine is configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter. |
| 申请公布号 |
US2016079992(A1) |
申请公布日期 |
2016.03.17 |
| 申请号 |
US201514857145 |
申请日期 |
2015.09.17 |
| 申请人 |
Intel Corporation |
发明人 |
Lu Cho-Ying;Li William Yee;Nguyen Khoa Minh;Ravi Ashoke;Yellepeddi Maneesha;Patel Binta M. |
| 分类号 |
H03L7/099;H03L7/08;H03L1/00 |
主分类号 |
H03L7/099 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A system for assigning a characterization and calibrating a parameter, the system comprising:
a frequency measurement circuit configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies; and a finite state machine configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter. |
| 地址 |
Santa Clara CA US |
