| 发明名称 |
DATA PATTERN DETECTING DEVICE, SEMICONDUCTOR DEVICE INCLUDING THE SAME, AND OPERATING METHOD THEREOF |
| 摘要 |
A pattern detecting device includes a length comparison unit suitable for comparing lengths of compressed input data and compressed reference data; and a data comparison unit suitable for comparing the compressed input data and the compressed reference data. |
| 申请公布号 |
US2016078051(A1) |
申请公布日期 |
2016.03.17 |
| 申请号 |
US201414549190 |
申请日期 |
2014.11.20 |
| 申请人 |
SK hynix Inc. ;Industry-University Cooperation Foundation Hanyang University |
发明人 |
KIM Dong-Wook;KANG Soo-Yong |
| 分类号 |
G06F17/30 |
主分类号 |
G06F17/30 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A pattern detecting device comprising:
a length comparison unit suitable for comparing lengths of compressed input data and compressed reference data; and a data comparison unit suitable for comparing the compressed input data and the compressed reference data. |
| 地址 |
Gyeonggi-do KR |
