发明名称 |
SEMICONDUCTOR LIGHT EMITTING ELEMENT, SEMICONDUCTOR LIGHT EMITTING ELEMENT MANUFACTURING METHOD, AND NEGATIVE ELECTRODE FORMING METHOD |
摘要 |
The present invention addresses the problem of reducing contact resistance between an n-type gallium nitride compound semiconductor layer and a negative electrode. A semiconductor light emitting element (100) relating to the present invention is provided with: a substrate (1); and a nitride semiconductor layer (20), which is formed on one surface (1a) side of the substrate (1), and which sequentially has, from the one surface (1a) side, an n-type gallium nitride compound semiconductor layer (3), a light emitting layer (4), and a p-type gallium nitride compound semiconductor layer (6). Furthermore, the semiconductor light emitting element (100) is provided with: a positive electrode (8) that is formed on the surface (6a) side of the p-type gallium nitride compound semiconductor layer (6); and a negative electrode (9) that is formed on an exposed surface (3a) of the n-type gallium nitride compound semiconductor layer (3). The negative electrode (9) is configured from a solidification structure having Ni and Al as main components. |
申请公布号 |
WO2016038856(A1) |
申请公布日期 |
2016.03.17 |
申请号 |
WO2015JP04471 |
申请日期 |
2015.09.03 |
申请人 |
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD. |
发明人 |
HAYASHI, SHINTARO;GOTO, KOJI;MINO, TAKUYA;YASUDA, MASAHARU |
分类号 |
H01L33/32;H01L33/38;H01L33/40 |
主分类号 |
H01L33/32 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|