发明名称 FUNCTIONALIZED GRID FOR SPECIFYING AND IMAGING POSITION OF BIOLOGICAL SAMPLE, AND METHOD OF APPLICATION THEREOF
摘要 PROBLEM TO BE SOLVED: To provide a functionalized sample support used in a charged particle microscope method.SOLUTION: A sample support includes a sample support surface constituted so as to support a sample, while examining the sample by using a charged particle microscope. The sample support surface has functionalized sites, and each functionalized site is constituted so as to keep the sample on the functionalized site by adhesion, attraction or a combination thereof.SELECTED DRAWING: Figure 10B
申请公布号 JP2016035450(A) 申请公布日期 2016.03.17
申请号 JP20150143527 申请日期 2015.07.19
申请人 FEI CO 发明人 UTLAUT MARK W;PARKER N WILLIAM
分类号 G01N1/28;C12M1/00;H01J37/20;H01J37/28 主分类号 G01N1/28
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