发明名称 FORMATION OF A I-III-VI2 SEMICONDUCTOR LAYER BY HEAT TREATMENT AND CHALCOGENIZATION OF AN I-III METALLIC PRECURSOR
摘要 A process for forming a semiconductor layer, especially with a view to photovoltaic applications, and more particularly to a process for forming a semiconductor layer of I-III-VI2 type by heat treatment and chalcogenization of a metallic precursor of I-III type, the process comprising: a heating step under an inert atmosphere during which the temperature increases uniformly up to a first temperature of between 460° C. and 540° C., in order to enable the densification of the metallic precursor, and a chalcogenization step beginning at said first temperature and during which the temperature continues to increase up to a second temperature, a stabilization temperature, of between 550° C. and 600° C., in order to enable the formation of the semiconductor layer. The formation of a semiconductor layer, or equivalently of an absorber, having a gain in conversion efficiency of around 4%, is thus advantageously achieved.
申请公布号 US2016079454(A1) 申请公布日期 2016.03.17
申请号 US201414888786 申请日期 2014.04.30
申请人 NEXCIS 发明人 Broussillou Cedric;Bodnar Sylvie
分类号 H01L31/032;H01L21/677;F27D7/06;H01L31/036;F27B9/10;H01L31/18;H01L21/67 主分类号 H01L31/032
代理机构 代理人
主权项 1. A process for forming a type I-III-VI2 semiconductor layer by heat treatment and chalcogenization, in at least one chamber of a furnace, of a type I-III metal precursor deposited on a substrate, the process comprising: a heating step under an inert atmosphere, during which the temperature uniformly increases to a first temperature of between 460° C. and 540° C., to enable densification of the metal precursor, and a chalcogenization step beginning at said first temperature and during which the temperature continues to increase to a second temperature, for stabilization, of between 550° C. and 600° C., to enable formation of the semiconductor layer.
地址 Rousset FR