| 摘要 |
PROBLEM TO BE SOLVED: To provide a socket for testing a semiconductor device and having an elastic body S contactor.SOLUTION: The socket for testing a semiconductor device and having an elastic body S contactor is provided which is used to electrically connect electrodes of a test device and contact balls of a semiconductor device with each other. The socket includes: contactors each of which has an upper stage portion protruding to one side from a vertical line and a lower stage portion connected to the upper stage portion and protruding to the other side so as to have elasticity by a structure that the upper stage portion and the lower stage portion are symmetric with each other, thereby transferring a force vertically generated to a Z-axis direction and coming into elastic contact with the electrodes of the test device and the contact balls of the semiconductor device; insulation parts each of which is made of an insulating elastic material and is formed integrally with the contactor to absorb the force generated when coming in contact with the contactor; and guide films each of which is formed with the insulating elastic body and is formed on the insulation part in order to align the contact balls of the semiconductor device and the contactors.SELECTED DRAWING: Figure 1 |
