发明名称 MIDDLE-OF-LINE (MOL) MANUFACTURED INTEGRATED CIRCUITS (ICs) EMPLOYING LOCAL INTERCONNECTS OF METAL LINES USING AN ELONGATED VIA, AND RELATED METHODS
摘要 Middle-of-line (MOL) manufactured integrated circuits (ICs) employing local interconnects of metal lines using an elongated via are disclosed. Related methods are also disclosed. In particular, different metal lines in a metal layer may need to be electrically interconnected during a MOL process for an IC. In this regard, to allow for metal lines to be interconnected without providing such interconnections above the metal lines that may be difficult to provide in a printing process for example, in an exemplary aspect, an elongated or expanded via(s) is provided in a MOL layer in an IC. The elongated via is provided in the MOL layer below the metal layer in the MOL layer and extended across two or more adjacent metal layers in the metal layer of the MOL layer. Moving the interconnections above the MOL layer can simplify the manufacturing of ICs, particularly at low nanometer (nm) node sizes.
申请公布号 WO2016039968(A1) 申请公布日期 2016.03.17
申请号 WO2015US46518 申请日期 2015.08.24
申请人 QUALCOMM INCORPORATED 发明人 ZHU, JOHN, JIANHONG;RIM, KERN;SONG, STANLEY, SEUNGCHUL;XU, JEFFREY, JUNHAO;YANG, DA
分类号 H01L27/02;H01L21/768;H01L23/522;H01L23/528;H01L23/538 主分类号 H01L27/02
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