发明名称 |
DEVICE AND METHOD FOR ALIGNMENT OF VERTICALLY STACKED WAFERS AND DIE |
摘要 |
A device is provided that includes a first die having a first alignment structure that includes a plurality of first transmission columns arranged in a pattern and a second die positioned on the first die, the second die having a second alignment structure that includes a plurality of second transmission columns arranged in the same pattern as the first transmission columns. The first and second transmission columns are each coplanar with a first surface and a second surface of the first and second die, respectively. |
申请公布号 |
US2016079131(A1) |
申请公布日期 |
2016.03.17 |
申请号 |
US201514951050 |
申请日期 |
2015.11.24 |
申请人 |
STMicroelectronics, Inc. |
发明人 |
ZHANG John H.;KLEEMEIER Walter;FERREIRA Paul;SAMPSON Ronald K. |
分类号 |
H01L21/66;H01L25/00 |
主分类号 |
H01L21/66 |
代理机构 |
|
代理人 |
|
主权项 |
1. A method of aligning a plurality of die, comprising:
positioning a first die having a first plurality of alignment structures overlying a second die having a second plurality of alignment structures, the first plurality of alignment structures having a first plurality of transmission columns arranged in a pattern and the second plurality of alignment structures having a second plurality of transmission columns arranged in the pattern of the first transmission columns; applying a first signal to the first plurality of alignment structures; detecting a second signal at the second plurality of alignment structures; determining a difference between the first and second signals; and adjusting a position of the first die with respect to the second die to decrease the difference between the first and second signals. |
地址 |
Coppell TX US |